IPSHIN - Im-Pesaran-Shin Panel Unit Root
Implements tests from Im, Pesaran and Shin, "Testing for Unit Roots in Heterogeneous Panels", J. of Econometrics, 2003, vol 115, pp 53-74. This aggregates the ADF test statistics computed separately across individuals. Under the null, the average ADF statistic has a Normal limiting distribution as N->infinity. This has been revised to add options for automatic lag selection, and to use REPORT rather than DISPLAY.
@ipshin( options ) series start end
Options
DET=NONE/[CONSTANT]/TREND (NONE is an error)
LAGS=(maximum number of) augmenting lags in the ADF regressions [Schwert's]
CRIT=[FIXED]/GTOS/AIC/BIC/HQ
Criterion to use to select the number of lags. This is done on an individual by individual basis. CRIT=FIXED uses the input LAGS on each. CRIT=GTOS starts with LAGS and drops lags until it hits one which has the marginal t with significance level set by the SLSTAY option. CRIT=AIC/BIC/HQ select the lag length using AIC, BIC (or SBC) or HQ.
SLSTAY=significance level to keep lag in model with METHOD=GTOS [.10]
SMPL=Dummy series with 0's in entries to skip [include all]
TITLE=title for output ["Im-Pesaran-Shin Unit Root Test: Series... "]
[PRINT]/NOPRINT
@ipshin( options ) series start end
Options
DET=NONE/[CONSTANT]/TREND (NONE is an error)
LAGS=(maximum number of) augmenting lags in the ADF regressions [Schwert's]
CRIT=[FIXED]/GTOS/AIC/BIC/HQ
Criterion to use to select the number of lags. This is done on an individual by individual basis. CRIT=FIXED uses the input LAGS on each. CRIT=GTOS starts with LAGS and drops lags until it hits one which has the marginal t with significance level set by the SLSTAY option. CRIT=AIC/BIC/HQ select the lag length using AIC, BIC (or SBC) or HQ.
SLSTAY=significance level to keep lag in model with METHOD=GTOS [.10]
SMPL=Dummy series with 0's in entries to skip [include all]
TITLE=title for output ["Im-Pesaran-Shin Unit Root Test: Series... "]
[PRINT]/NOPRINT